The research focus of our group “Nanostructuring and Scanning Probe
is on fabrication, analysis, properties and applications of functional
nanostructures. We develop the corresponding techniques for nanolithography
(“Top-Down Approach”) as well as novel processes for nanostructure
formation by self-organization (“Bottom-Up Approach”). The
Atomic Force Microscope (AFM) is used both for structuring and imaging.
The developments of our group, which lead to 20 patents filed so far, include the world´s smallest transistor, a novel process allowing for nanocontact printing and crystalline nanowires with 30-fold increased mechanical yield strength.
The Atomic Transistor. The controlled repositioning of
one single silver atom allows for the reversible opening and closing of an
Nanoanalytics and nanolithography via AFM. Functional chemical
patterns on surfaces can be written and subsequently imaged with the same AFM
Pattern formation of the nanometer scale by self-organization.
An example is shown for metallic nanowires.